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92
Mots clés
Ion implantation
Silica
Ferromagnetic resonance
Silicon Carbide
Auger electron spectroscopy AES
Topological defects
18O resonance
Passivation
7550Pp
X-ray diffraction
Al2O3
Interface defects
Adsorbed layers
Gold
Defects
Isotopic Tracing
Epitaxial growth
Nickel
17O
Silicon
Alloy
17Opp
GaMnAs
Oxygen deficiency
Adsorption Isotherms
Channeling
17Op
Magnetic semiconductors
XRD
2H
Epitaxy
Gallium oxide
Periodic multilayer
Low energy electron diffraction LEED
PIXE
Ion beam analysis
Thin films
AFM
SiC
ALD
7550Ee
Sputtering
18O
Indium oxide
Aluminium
Acoustic
3C-SiC
Kossel diffraction
AC susceptibility
NRP
Density functional theory
Thin film
Topological insulators
Annealing
13C
27Aldp
Alloys
27Alda
Oxidation
8140Ef
Pb centers
RBS
Energy loss
Stable isotopic tracing
27Ald p&α
Nanostructures
Magnetic anisotropy
Growth
Capillary condensation
Transparent conductive oxide TCO
Magnetization curves
HfO2
Aluminum
Nitridation
ADSORPTION DESORPTION HYSTERESIS
15N
Ageing
EPR
Silicon carbide
Diffusion
Metal-insulator transition
Hysteresis
Nuclear reaction analysis
Zinc oxide
Acoustic propreties of solid
Raman spectroscopy
XPS
Charge exchange
Atomic Layer Deposition ALD
Rutherford backscattering spectrometry RBS
Multilayer
7630Lh
6855Jk
Photoluminescence
Evaluation
Nanoparticles
Pulsed laser deposition
Nuclear resonance profiling NRP
Adsorption
Measurement